Scanning Acoustic Microscopy |
Function Summary |
Based on the principle of ultrasonic testing, using high frequency focused ultrasound probe, the Scanning Acoustic Microscope can be used to detect cracks, delamination, voids, bubble, porosity and other defects in the surface, sub-surface and internal of opaque objects. |
The self-development Scanning Acoustic Microscope is completely developed by Center for Nondestructive Testing and Control, Beijing Institute of Technology. It can be applied in failure analysis of semiconductor, electronic packaging, circuit board welding, material texture observation, biomedical and other fields of non-destructive testing and observation. |
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SAM system |
Technical features |
Scanning axis adopting linear motor closed-loop control, High precision, High scanning speed |
Full-wave acquisition and storage, realizing image observation at any depth |
Different imaging methods, including Peak imaging, TOF imaging, Frequency domain imaging, etc., realizing observation and analysis of a variety of physical properties |
Gate following function, realizing real-time following scanning of the workpiece top surface |
Specifications |
Scanning range:350×300mm |
Minimum distance between sample points of the scan axis: 8μm |
Maximum scanning speed:1500mm/s |
Travel distance of the focusing axis: 150mm |
Maximum sampling frequency:4GHz |
Frequency range:10 - 400MHz |
Technical principle |
Ultrasonic microscopic scanning system consists of a high frequency focused ultrasonic transducer, a motion control system, a data acquisition system, and a computer. The high frequency focused ultrasonic transducer transmits and receives high frequency ultrasound. The motion control system controls the velocity and the location of the ultrasonic transducer. The data acquisition system controls the generating, receiving and transmitting of the ultrasonic signals, and converses analog signals to digital signals. The computer integrates the position and ultrasonic signal information and generates the test result image. |